Transmission Electron Microscopy

Transmission Electron Microscopy facility provides researchers with unparalleled capabilities for nanoscale structural characterization and analysis. TEM technology enables direct visualization of specimen internal structure by transmitting a focused electron beam through ultra-thin samples, achieving atomic-level resolution down to 0.05 nanometers.

This powerful imaging technique is essential for materials science, biological research, nanotechnology, and semiconductor development, offering both high-resolution imaging and analytical capabilities including selected area electron diffraction (SAED) and energy-dispersive X-ray spectroscopy (EDS). 

Whether you’re examining cellular ultrastructure, characterizing nanoparticles, analyzing thin films, or investigating crystal defects, our TEM facility delivers the precision and expertise needed to reveal the fundamental details that drive scientific discovery.