Scanning Electron Microscopy

Our JEOL JSM 6480 Scanning Electron Microscope delivers high-resolution imaging with magnifications up to 300,000x and resolution down to 3.0 nm. It is ideal for routine materials characterization, quality control, and research applications. The system includes secondary electron and backscattered electron imaging capabilities, along with EDS compatibility for elemental analysis. Perfect for examining surface morphology, microstructures, and conducting failure analysis across diverse material types.

Manufacturer: JOEL Ltd.
Model: JSM 6480
Equipment Location: Grigg 147 / Duke 240

An Energy Dispersive X-ray Spectroscopy (EDS) system used for elemental analysis and chemical characterization. Typically paired with SEM for precise surface composition analysis. Offers both assisted and independent operation options. Available for research use by internal and external users. Requires training prior to non-assisted access. Located in core research labs supporting materials science and engineering.

Manufacturer: Oxford Instruments
Model: INCA EDS
Equipment Location: Grigg 147 / Duke 240

The Denton Desk IV Coater is a compact, benchtop sputter coater designed for SEM/TEM sample preparation. It provides uniform, fine-grain conductive coatings like gold, platinum, or carbon using magnetron sputtering or optional carbon evaporation. The system includes built-in vacuum pumps and supports features like rotation, tilt, and etching for precise thin-film deposition. Ideal for high-resolution imaging, it ensures low-temperature operation to protect delicate samples.

Manufacturer: Denton Vacuum
Model: Desk IV sputter coater
Equipment Location: Duke 240